19 December 2013 An improved image mosaic algorithm based on feature points matching
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Proceedings Volume 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology; 90450C (2013) https://doi.org/10.1117/12.2037223
Event: International Conference on Optical Instruments and Technology (OIT2013), 2013, Beijing, China
Abstract
To solve the issue of low precision and poor real-time performance in image registration, this paper presents an algorithm for extracting and matching of image feature points based on an invariant feature algorithm of the complementation between Harris operator corner detection and SIFT algorithm. First, with Harris operator ‘s quick calculating, the algorithm extracts much corner points in the image as original feature points. Then, description goes to the feature vector of pre-selected feature points on the strike of scale-space invariant features transform (SIFT), thus obtaining descriptors of feature points. By calculating the minimum Euclidean distance of two points in vectors of different feature points described by the SIFT algorithm in the two to-be-spliced images, the accurate image matching is then achieved. Experiments demonstrate that the algorithm combines the rapid achieve performance of Harris operator and the scale-space invariance of the SIFT algorithm, which boasts good robustness for translation, whirling and scaling transformation. In the experiments of 100 images, when there occurs the translation, whirling or scaling transformation to the image, the fully consistent ratio between the coordinates of matching points and the actual coordinates with using this algorithm is over 95%. This algorithm can quickly extract with high precision feature points for matching to achieve the seamless images.
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Yufeng Li, Yufeng Li, Shaohu Gu, Shaohu Gu, Fei Liu, Fei Liu, } "An improved image mosaic algorithm based on feature points matching ", Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450C (19 December 2013); doi: 10.1117/12.2037223; https://doi.org/10.1117/12.2037223
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