19 December 2013 Signal process research in quartz crystal chip counting system
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Proceedings Volume 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology; 90451P (2013) https://doi.org/10.1117/12.2038085
Event: International Conference on Optical Instruments and Technology (OIT2013), 2013, Beijing, China
Abstract
Quartz crystal chip discussed in this paper is a semitransparent crystal with thickness of 0.1~0.2 mm. Generally these chips are packaged into one block with 100 or 200 pieces. Mostly, the counting job is accomplished by weighing the chips, however, thickness difference of each crystal will lead to the inaccurate counting results. A new counting method with imaging and signal processing is proposed in this paper. At first, the edge images of crystal are acquired, thus edge information will be turned into edge signals, then the signal will be enhanced, the noise will be decreased. At last the accurate amount will be get from these edge signals. This method has good practical value because of contact less, high efficiencies and high accuracy.
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Zhebo Chen, Zhebo Chen, Qingguang Chen, Qingguang Chen, Yajing Ji, Yajing Ji, } "Signal process research in quartz crystal chip counting system", Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451P (19 December 2013); doi: 10.1117/12.2038085; https://doi.org/10.1117/12.2038085
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