19 December 2013 A compensation method for 3D imaging LADAR based on detected surface slope
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Proceedings Volume 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology; 90451T (2013) https://doi.org/10.1117/12.2038139
Event: International Conference on Optical Instruments and Technology (OIT2013), 2013, Beijing, China
Abstract
Basing on the measurement of pulse time-of-flight, 3D imaging LADAR have ability to obtain the profile of target surface. As the convolution results of impulse response function of footprint and probe pulse, the reflected pulse will distort if the footprint contain a variety of distances. After discriminate process, this distort brings in a time error for distance measurement, which becomes the anamorphose on system imaging further more. According to the discussion of time-dependent scattering cross section, this kind of anamorphose is mainly decided by the slope of target surface when the system parameters and target distance are determined. A compensation method for height error based on detected slope has been put forward. First of all, the slope distribution of detected surface could be calculated from the point cloud data by two-way difference method. Then, the approximate compensation height error will be obtained, according to the slope-error relationship by assuming that each footprint be a tilting plane. After adding to the detected data, the first approximate target surface data has been acquired. The compensation result will approaching the real value by repeating the three steps above. As an example, simulation analysis of Gaussian pulse imaging detection has been given. The result shows that this compensation method is effective and efficient.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Miao Yu, Tong-gang Zhao, Jian-hua Ren, Daxiong Xu, "A compensation method for 3D imaging LADAR based on detected surface slope", Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90451T (19 December 2013); doi: 10.1117/12.2038139; https://doi.org/10.1117/12.2038139
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