PROCEEDINGS VOLUME 9046
INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY (OIT2013) | 17-19 NOVEMBER 2013
2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY (OIT2013)
17-19 November 2013
Beijing, China
Front Matter: Volume 9046
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904601 (20 December 2013); doi: 10.1117/12.2054693
Optoelectronic Technology in Metrology
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904602 (19 December 2013); doi: 10.1117/12.2037040
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904603 (19 December 2013); doi: 10.1117/12.2034061
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904604 (19 December 2013); doi: 10.1117/12.2038063
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904605 (19 December 2013); doi: 10.1117/12.2038097
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904606 (19 December 2013); doi: 10.1117/12.2034671
Optoelectronic Measurement and Detection
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904607 (19 December 2013); doi: 10.1117/12.2034238
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904608 (19 December 2013); doi: 10.1117/12.2034668
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904609 (19 December 2013); doi: 10.1117/12.2035538
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460A (19 December 2013); doi: 10.1117/12.2037422
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460B (19 December 2013); doi: 10.1117/12.2037804
Optoelectronic Instruments and Systems I
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460C (19 December 2013); doi: 10.1117/12.2037576
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460D (19 December 2013); doi: 10.1117/12.2034364
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460E (19 December 2013); doi: 10.1117/12.2036405
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460F (19 December 2013); doi: 10.1117/12.2036677
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460G (19 December 2013); doi: 10.1117/12.2037301
Optoelectronic Instruments and Systems II
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460H (19 December 2013); doi: 10.1117/12.2037648
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460I (19 December 2013); doi: 10.1117/12.2037268
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460J (19 December 2013); doi: 10.1117/12.2037222
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460K (19 December 2013); doi: 10.1117/12.2041746
Poster Session
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460L (19 December 2013); doi: 10.1117/12.2034480
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460M (19 December 2013); doi: 10.1117/12.2034525
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460N (19 December 2013); doi: 10.1117/12.2034662
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460O (19 December 2013); doi: 10.1117/12.2035177
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460P (19 December 2013); doi: 10.1117/12.2035368
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460Q (19 December 2013); doi: 10.1117/12.2035917
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460R (19 December 2013); doi: 10.1117/12.2036107
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460S (19 December 2013); doi: 10.1117/12.2036313
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460T (19 December 2013); doi: 10.1117/12.2036314
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460U (19 December 2013); doi: 10.1117/12.2036317
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460V (19 December 2013); doi: 10.1117/12.2036508
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460W (19 December 2013); doi: 10.1117/12.2036515
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460X (19 December 2013); doi: 10.1117/12.2036537
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460Y (19 December 2013); doi: 10.1117/12.2036576
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460Z (19 December 2013); doi: 10.1117/12.2036643
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904610 (19 December 2013); doi: 10.1117/12.2036710
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904611 (19 December 2013); doi: 10.1117/12.2036965
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904612 (19 December 2013); doi: 10.1117/12.2037012
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904613 (19 December 2013); doi: 10.1117/12.2037491
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904614 (19 December 2013); doi: 10.1117/12.2037509
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904615 (19 December 2013); doi: 10.1117/12.2037667
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904616 (19 December 2013); doi: 10.1117/12.2037740
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904617 (19 December 2013); doi: 10.1117/12.2037779
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904618 (19 December 2013); doi: 10.1117/12.2037816
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904619 (19 December 2013); doi: 10.1117/12.2037841
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90461A (19 December 2013); doi: 10.1117/12.2038016
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90461B (19 December 2013); doi: 10.1117/12.2038038
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90461C (19 December 2013); doi: 10.1117/12.2038043
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90461D (19 December 2013); doi: 10.1117/12.2038131
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90461E (19 December 2013); doi: 10.1117/12.2038181
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90461F (19 December 2013); doi: 10.1117/12.2038192
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90461G (19 December 2013); doi: 10.1117/12.2038280
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90461H (19 December 2013); doi: 10.1117/12.2042047
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90461I (19 December 2013); doi: 10.1117/12.2042640
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90461J (19 December 2013); doi: 10.1117/12.2044447
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