Research on light scattering from randomly rough metal and dielectric surfaces with Monte Carlo method based on method of moment

Keding Yan; Huasong Chen; Zhenhua Li

doi:10.1117/12.2034668

19 December 2013 Research on light scattering from randomly rough metal and dielectric surfaces with Monte Carlo method based on method of moment

Keding Yan, Huasong Chen, Zhenhua Li

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Proceedings Volume 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 904608 (2013) https://doi.org/10.1117/12.2034668
Event: International Conference on Optical Instruments and Technology (OIT2013), 2013, Beijing, China

Abstract

In order to study light scattering from randomly rough surface, the linear filtering method is used to generate Gaussian randomly rough surface, and the method of moments is used to calculate the scattering light intensity distribution from perfect conduct and dielectric surfaces. The calculation results show that scattering characteristics between conductor and dielectric surfaces exist several significant differences: (1) the scattering peak value of perfectly conduct is larger than scattering peak value of dielectric on the same roughness; (2) the difference between s- and ppolarized scattering results are rather small in perfectly conduct randomly rough surfaces, while there is a obvious difference between s- and p-polarized scattering results in the condition of dielectric randomly rough surfaces; (3) though in both conditions of perfectly conduct and dielectric randomly rough surfaces, there is a shift from specular to backscattering direction when incident is p-polarized light, however, in dielectric randomly rough surface situation, the shift is much more obvious than in conduct situation.

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Keding Yan, Huasong Chen, and Zhenhua Li "Research on light scattering from randomly rough metal and dielectric surfaces with Monte Carlo method based on method of moment", Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904608 (19 December 2013); https://doi.org/10.1117/12.2034668

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KEYWORDS

Light scattering

Scattering

Dielectrics

Monte Carlo methods

Backscatter

Metals

Linear filtering

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