19 December 2013 Research on modern test system for resolution of white-light sighting telescope
Author Affiliations +
Abstract
Resolution is one of the important indexes of examining optical sighting telescope performance. Traditional and subjective test methods generally adopted auxiliary visual instrument reading to achieve resolution test, which was greatly affected by subjective factors, and easy fatigue affected test precision, and it didn’t objectively and quantitatively reflect the resolution of measured sighting telescope. Taking aim at the test requirements, on the basis of overcoming the shortcomings of traditional and subjective test methods, and this paper designed a set of modern test system for resolution of white-light sighting telescope, which employed automatic focusing technology, CCD imaging technology, precision machinery technology, automatic control technology and computer image acquisition technology. Through automatic focusing of zoom lens and man-computer interaction, computer displayed and saved results automatically, which eliminated subjective error of the traditional and subjective test method. The experimental results showed that the test precision of resolution was 0.24″, which achieved the technical specification less than 0.5″, and the test accuracy was ensured.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ru-guang Liu, Ru-guang Liu, Zuo-jiang Xiao, Zuo-jiang Xiao, Zhi-yong An, Zhi-yong An, Pei-pei Wen, Pei-pei Wen, Xin-ting Zhang, Xin-ting Zhang, "Research on modern test system for resolution of white-light sighting telescope", Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904610 (19 December 2013); doi: 10.1117/12.2036710; https://doi.org/10.1117/12.2036710
PROCEEDINGS
6 PAGES


SHARE
RELATED CONTENT

The DESI instrument control system
Proceedings of SPIE (August 07 2016)
Imaging Flow Cytometer
Proceedings of SPIE (June 12 1989)
Introducing multiple-dynamic-windows in thermal imaging
Proceedings of SPIE (February 28 1991)

Back to Top