Paper
31 March 2014 Glass ceramic ZERODUR enabling nanometer precision
Ralf Jedamzik, Clemens Kunisch, Johannes Nieder, Thomas Westerhoff
Author Affiliations +
Abstract
The IC Lithography roadmap foresees manufacturing of devices with critical dimension of < 20 nm. Overlay specification of single digit nanometer asking for nanometer positioning accuracy requiring sub nanometer position measurement accuracy. The glass ceramic ZERODUR® is a well-established material in critical components of microlithography wafer stepper and offered with an extremely low coefficient of thermal expansion (CTE), the tightest tolerance available on market. SCHOTT is continuously improving manufacturing processes and it’s method to measure and characterize the CTE behavior of ZERODUR® to full fill the ever tighter CTE specification for wafer stepper components. In this paper we present the ZERODUR® Lithography Roadmap on the CTE metrology and tolerance. Additionally, simulation calculations based on a physical model are presented predicting the long term CTE behavior of ZERODUR® components to optimize dimensional stability of precision positioning devices. CTE data of several low thermal expansion materials are compared regarding their temperature dependence between - 50°C and + 100°C. ZERODUR® TAILORED 22°C is full filling the tight CTE tolerance of +/- 10 ppb / K within the broadest temperature interval compared to all other materials of this investigation. The data presented in this paper explicitly demonstrates the capability of ZERODUR® to enable the nanometer precision required for future generation of lithography equipment and processes.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ralf Jedamzik, Clemens Kunisch, Johannes Nieder, and Thomas Westerhoff "Glass ceramic ZERODUR enabling nanometer precision", Proc. SPIE 9052, Optical Microlithography XXVII, 90522I (31 March 2014); https://doi.org/10.1117/12.2046352
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications and 4 patents.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Ceramics

Lithography

Tolerancing

Zerodur

Glasses

Metrology

Semiconducting wafers

Back to Top