Paper
1 April 2014 Instability caused by parasitic resistances in piezoelectric shunt damping system with negative capacitor
Kento Okumura, Kentaro Takagi, Tsuyoshi Inoue, Ichiro Jikuya
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Abstract
This paper studies the stability problem for a piezoelectric shunt damping system with a simple negative capacitor circuit. A key issue is to consider perturbations of parasitic series and parallel-leakage resistances in a piezoelectric element. Then, it is a bit surprising that the perturbed system becomes unstable, in particular, due to the effect of the parasitic leakage resistance. This instability phenomenon is analytically proved based on the Routh-Hurwitz stability criterion and is also demonstrated by numerical simulations. This paper then illustrates robustification of a negative capacitor circuit by inserting a negative resistance in parallel with the negative capacitor in the simple negative capacitor circuit. This robustification is also demonstrated by a numerical simulation.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kento Okumura, Kentaro Takagi, Tsuyoshi Inoue, and Ichiro Jikuya "Instability caused by parasitic resistances in piezoelectric shunt damping system with negative capacitor", Proc. SPIE 9057, Active and Passive Smart Structures and Integrated Systems 2014, 905738 (1 April 2014); https://doi.org/10.1117/12.2046192
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Capacitors

Resistance

Capacitance

Piezoelectric effects

Amplifiers

Numerical simulations

Systems modeling

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