17 December 2013 Multiple-wave diffraction in x-ray interferometers
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Proceedings Volume 9066, Eleventh International Conference on Correlation Optics; 90661B (2013) https://doi.org/10.1117/12.2053240
Event: Eleventh International Conference on Correlation Optics, 2013, Chernivsti, Ukraine
Abstract
Analysis of multiple-wave diffraction in multi-unit X-ray interferometers is made. Geometry of multiple-wave diffractions and X-ray reflection factors Rm (t) are analyzed. Experimental moiré patterns for the case of LLLinterferometer at (000, 220, 022) diffraction are obtained. The advantages of multiple-wave diffraction in the determination of displacement and strain vector components as well the Burgers vector components are highlighted.
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Mykola Raransky, Mykola Raransky, Vitaliy Balazyuk, Vitaliy Balazyuk, Mykola Melnyk, Mykola Melnyk, Olga Kniginitska, Olga Kniginitska, Mykhailo Gunko, Mykhailo Gunko, Maria Kshevetska, Maria Kshevetska, } "Multiple-wave diffraction in x-ray interferometers", Proc. SPIE 9066, Eleventh International Conference on Correlation Optics, 90661B (17 December 2013); doi: 10.1117/12.2053240; https://doi.org/10.1117/12.2053240
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