17 December 2013 Moire effects arising on mechanical treatment of single crystal surface
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Proceedings Volume 9066, Eleventh International Conference on Correlation Optics; 90661C (2013) https://doi.org/10.1117/12.2053248
Event: Eleventh International Conference on Correlation Optics, 2013, Chernivsti, Ukraine
Abstract
X-ray diffraction moiré methods in the geometry of L-L-L Laue diffraction have been used to determine crystal structure defects arising in the near-surface Si layers on mechanical treatment (cutting with diamond disc and grinding). A model of damaged layer has been proposed and zone dimensions have been determined, namely polycrystalline structure, microcracks, dislocation assemblies and packing defects, crystal elastic strain.
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Mykola Raransky, Mykola Raransky, Vitaliy Balazyuk, Vitaliy Balazyuk, Mykola Melnyk, Mykola Melnyk, Olga Kniginitska, Olga Kniginitska, Mykhailo Gunko, Mykhailo Gunko, } "Moire effects arising on mechanical treatment of single crystal surface", Proc. SPIE 9066, Eleventh International Conference on Correlation Optics, 90661C (17 December 2013); doi: 10.1117/12.2053248; https://doi.org/10.1117/12.2053248
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