10 January 2014 A geometrical defect detection method for non-silicon MEMS part based on HU moment invariants of skeleton image
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Proceedings Volume 9069, Fifth International Conference on Graphic and Image Processing (ICGIP 2013); 90691R (2014) https://doi.org/10.1117/12.2050105
Event: Fifth International Conference on Graphic and Image Processing, 2013, Hong Kong, China
Abstract
In order to improve the accuracy of geometrical defect detection, this paper presented a method based on HU moment invariants of skeleton image. This method have four steps: first of all, grayscale images of non-silicon MEMS parts are collected and converted into binary images, secondly, skeletons of binary images are extracted using medialaxis- transform method, and then HU moment invariants of skeleton images are calculated, finally, differences of HU moment invariants between measured parts and qualified parts are obtained to determine whether there are geometrical defects. To demonstrate the availability of this method, experiments were carried out between skeleton images and grayscale images, and results show that: when defects of non-silicon MEMS part are the same, HU moment invariants of skeleton images are more sensitive than that of grayscale images, and detection accuracy is higher. Therefore, this method can more accurately determine whether non-silicon MEMS parts qualified or not, and can be applied to nonsilicon MEMS part detection system.
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Xu Cheng, Xin Jin, Zhijing Zhang, Jun Lu, "A geometrical defect detection method for non-silicon MEMS part based on HU moment invariants of skeleton image", Proc. SPIE 9069, Fifth International Conference on Graphic and Image Processing (ICGIP 2013), 90691R (10 January 2014); doi: 10.1117/12.2050105; https://doi.org/10.1117/12.2050105
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