Imaging system sensitivity analysis with NV-IPM

Jonathan Fanning; Brian Teaney

doi:10.1117/12.2052731

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29 May 2014 Imaging system sensitivity analysis with NV-IPM

Jonathan Fanning, Brian Teaney

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Proceedings Volume 9071, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV; 90710J (2014) https://doi.org/10.1117/12.2052731
Event: SPIE Defense + Security, 2014, Baltimore, Maryland, United States

Abstract

This paper describes the sensitivity analysis capabilities to be added to version 1.2 of the NVESD imaging sensor model NV-IPM. Imaging system design always involves tradeoffs to design the best system possible within size, weight, and cost constraints. In general, the performance of a well designed system will be limited by the largest, heaviest, and most expensive components. Modeling is used to analyze system designs before the system is built. Traditionally, NVESD models were only used to determine the performance of a given system design. NV-IPM has the added ability to automatically determine the sensitivity of any system output to changes in the system parameters. The component-based structure of NV-IPM tracks the dependence between outputs and inputs such that only the relevant parameters are varied in the sensitivity analysis. This allows sensitivity analysis of an output such as probability of identification to determine the limiting parameters of the system. Individual components can be optimized by doing sensitivity analysis of outputs such as NETD or SNR. This capability will be demonstrated by analyzing example imaging systems.

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Jonathan Fanning and Brian Teaney "Imaging system sensitivity analysis with NV-IPM", Proc. SPIE 9071, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV, 90710J (29 May 2014); https://doi.org/10.1117/12.2052731

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