An overview of polarimetric sensing techniques and technology with applications to different research fields

Frans Snik; Julia Craven-Jones; Michael Escuti; Silvano Fineschi; David Harrington; Antonello De Martino; Dimitri Mawet; Jérôme Riedi; J. Scott Tyo

doi:10.1117/12.2053245

21 May 2014 An overview of polarimetric sensing techniques and technology with applications to different research fields

Frans Snik, Julia Craven-Jones, Michael Escuti, Silvano Fineschi, David Harrington, Antonello De Martino, Dimitri Mawet, Jérôme Riedi, J. Scott Tyo

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Proceedings Volume 9099, Polarization: Measurement, Analysis, and Remote Sensing XI; 90990B (2014) https://doi.org/10.1117/12.2053245
Event: SPIE Sensing Technology + Applications, 2014, Baltimore, Maryland, United States

Abstract

We report the main conclusions from an interactive, multidisciplinary workshop on “Polarimetric Techniques and Technology”, held on March 24-28 2014 at the Lorentz Center in Leiden, the Netherlands. The work- shop brought together polarimetrists from different research fields. Participants had backgrounds ranging from academia to industrial RD. Here we provide an overview of polarimetric instrumentation in the optical regime geared towards a wide range of applications: atmospheric remote sensing, target detection, astronomy, biomedical applications, etc. We identify common approaches and challenges. We list novel polarimetric techniques and polarization technologies that enable promising new solutions. We conclude with recommendations to the polarimetric community at large on joint efforts for exchanging expertise.

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Frans Snik, Frans Snik, Julia Craven-Jones, Julia Craven-Jones, Michael Escuti, Michael Escuti, Silvano Fineschi, Silvano Fineschi, David Harrington, David Harrington, Antonello De Martino, Antonello De Martino, Dimitri Mawet, Dimitri Mawet, Jérôme Riedi, Jérôme Riedi, J. Scott Tyo, J. Scott Tyo, "An overview of polarimetric sensing techniques and technology with applications to different research fields", Proc. SPIE 9099, Polarization: Measurement, Analysis, and Remote Sensing XI, 90990B (21 May 2014); doi: 10.1117/12.2053245; https://doi.org/10.1117/12.2053245

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