PROCEEDINGS VOLUME 9110
SPIE SENSING TECHNOLOGY + APPLICATIONS | 5-9 MAY 2014
Dimensional Optical Metrology and Inspection for Practical Applications III
IN THIS VOLUME

8 Sessions, 26 Papers, 0 Presentations
3D Methods I  (4)
Proceedings Volume 9110 is from: Logo
SPIE SENSING TECHNOLOGY + APPLICATIONS
5-9 May 2014
Baltimore, Maryland, United States
Front Matter: Volume 9110
Proc. SPIE 9110, Front Matter: Volume 9110, 911001 (12 June 2014); https://doi.org/10.1117/12.2072208
3D Analysis and Calibration
Proc. SPIE 9110, Active versus passive projector nonlinear gamma compensation method for high-quality fringe pattern generation, 911002 (28 May 2014); https://doi.org/10.1117/12.2050534
Proc. SPIE 9110, Comparing digital-light-processing (DLP) and liquid-crystal-on-silicon (LCoS) technologies for high-quality 3D shape measurement, 911004 (28 May 2014); https://doi.org/10.1117/12.2050786
Proc. SPIE 9110, Improved measurement dynamic range for point triangulation probes, 911006 (28 May 2014); https://doi.org/10.1117/12.2051171
Proc. SPIE 9110, Error correction for Moiré based creep measurement system, 911007 (28 May 2014); https://doi.org/10.1117/12.2050595
3D Methods I
Proc. SPIE 9110, Development of in-plane and out-of-plane deformation simultaneous measurement method by using only two speckle patterns, 911008 (28 May 2014); https://doi.org/10.1117/12.2050113
Proc. SPIE 9110, Low-coherence interferometer using a pulsation laser diode, 911009 (28 May 2014); https://doi.org/10.1117/12.2050190
Proc. SPIE 9110, Three dimensional imaging with multiple wavelength speckle interferometry, 91100A (28 May 2014); https://doi.org/10.1117/12.2053834
Proc. SPIE 9110, Digital fringe profilometry based on triangular fringe patterns and spatial shift estimation, 91100C (28 May 2014); https://doi.org/10.1117/12.2049791
3D Methods II
Proc. SPIE 9110, Array-projected aperiodic sinusoidal fringes for high-speed 3-D shape measurement, 91100D (28 May 2014); https://doi.org/10.1117/12.2050410
Proc. SPIE 9110, High-speed 3D surface measurement with a fringe projection based optical sensor, 91100E (28 May 2014); https://doi.org/10.1117/12.2053224
Proc. SPIE 9110, Full-field step profile measurement with sinusoidal wavelength scanning interferometer, 91100F (28 May 2014); https://doi.org/10.1117/12.2053539
3D Applications I
Proc. SPIE 9110, Advanced defect and metrology solutions, 91100G (28 May 2014); https://doi.org/10.1117/12.2052934
Proc. SPIE 9110, Optical center alignment technique based on inner profile measurement method, 91100I (28 May 2014); https://doi.org/10.1117/12.2050892
Proc. SPIE 9110, Deformation kinetics of layered personal protective material under impact via terahertz reflectometry, 91100K (28 May 2014); https://doi.org/10.1117/12.2049792
Proc. SPIE 9110, Ultra-broadband high-resolution photoacoustic / photothermal microscopy system for material characterization, 91100L (28 May 2014); https://doi.org/10.1117/12.2053405
3D Applications II
Proc. SPIE 9110, Progress in the specification of optical instruments for the measurement of surface form and texture, 91100M (28 May 2014); https://doi.org/10.1117/12.2054435
Proc. SPIE 9110, Metrology tool for fast measurement of patterned sapphire substrate used in LED manufacturing, 91100N (28 May 2014); https://doi.org/10.1117/12.2053485
Proc. SPIE 9110, Dimensional metrology on a semiconductor packaging process using an optical comb, 91100O (28 May 2014); https://doi.org/10.1117/12.2049522
Metrology Applications
Proc. SPIE 9110, Development of portable 3D optical measuring system using structured light projection method, 91100Q (28 May 2014); https://doi.org/10.1117/12.2048896
Proc. SPIE 9110, Order and defectivity nanometrology by image processing and analysis of sub-20 nm BCPs features for lithographic applications, 91100R (28 May 2014); https://doi.org/10.1117/12.2050182
Proc. SPIE 9110, Super finished surface roughness measurement sensor for hard access area, 91100S (28 May 2014); https://doi.org/10.1117/12.2052708
Proc. SPIE 9110, Optical design of a structured light phase shift system using no moving parts, 91100T (28 May 2014); https://doi.org/10.1117/12.2050001
Poster Session
Proc. SPIE 9110, Three-dimensional shape measurement system applied to superficial inspection of non-metallic pipes for the hydrocarbons transport, 91100U (28 May 2014); https://doi.org/10.1117/12.2050220
Proc. SPIE 9110, Study on the stitching interferometry for the surface profile measurement of a large aperture component, 91100W (28 May 2014); https://doi.org/10.1117/12.2053182
Proc. SPIE 9110, Accurate and flexible calibration technique for fringe projection profilometry by using encoded points and Fourier analysis, 91100X (5 June 2014); https://doi.org/10.1117/12.2069929
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