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This PDF file contains the front matter associated with SPIE Proceedings Volume 9110, including the Title Page, Copyright information, Table of Contents, Invited Panel Discussion, and Conference Committee listing.

The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from this book:

Author(s), “Title of Paper,” in Dimensional Optical Metrology and Inspection for Practical Applications III, edited by Kevin G. Harding, Toru Yoshizawa, Song Zhang, Proceedings of SPIE Vol. 9110 (SPIE, Bellingham, WA, 2014) Article CID Number.

ISSN: 0277-786X

ISBN: 9781628410471

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Conference Committee

Symposium Chair

  • David A. Whelan, Boeing Defense, Space, and Security (United States)

Symposium Co-chair

  • Wolfgang Schade, Technische Universität Clausthal (Germany) and Fraunhofer Heinrich-Hertz-Institut (Germany)

Conference Chairs

  • Kevin G. Harding, GE Global Research (United States)

  • Toru Yoshizawa, NPO 3D Associates (Japan)

Conference Co-chair

  • Song Zhang, Iowa State University (United States)

Conference Program Committee

  • Yasuhiko Arai, Kansai University (Japan)

  • Anand Krishna Asundi, Nanyang Technological University (Singapore)

  • Mehdi Daneshpanah, KLA-Tencor Corporation (United States)

  • Khaled J. Habib, Kuwait Institute for Scientific Research (Kuwait)

  • Qingying Jim Hu, QUEST Integrated, Inc. (United States)

  • Katsuichi Kitagawa, Toray Precision Company, Ltd. (Japan)

  • Peter Kühmstedt, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

  • Yukitoshi Otani, Utsunomiya University (Japan)

  • Xianyu Su, Sichuan University (China)

  • Takamasa Suzuki, Niigata University (Japan)

  • Joseph D. Tobiason, Micro Encoder Inc. (United States)

  • Rainer Tutsch, Technische Universität Braunschweig (Germany)

  • Jiangtao Xi, University of Wollongong (Australia)

Session Chairs

  • 3D Analysis and Calibration

    Kevin G. Harding, GE Global Research (United States)

    Yasuhiko Arai, Kansai University (Japan)

  • 3D Methods I

    Toru Yoshizawa, NPO 3D Associates (Japan)

  • 3D Methods II

    Takamasa Suzuki, Niigata University (Japan)

  • 3D Applications I

    Song Zhang, Iowa State University (United States)

  • 3D Applications II

    Jiangtao Xi, University of Wollongong (Australia)

  • Metrology Applications

    Yukitoshi Otani, Utsunomiya University (Japan)


The field of Optical Metrology for Practical Applications continues to grow with the needs of the manufacturing and service communities need for more complete information. Structured light continues to be a core method for many applications with papers in this volume addressing how to reduce projector noise, improve calibration, and improve speed. Some applications covered in this volume include LED manufacturing, pipe inspection, material characterization, semiconductor manufacturing, and surface metrology. The papers presented in this volume represent many of the current and future state-of-the-art instruments of the metrology industry.

Kevin G. Harding

Toru Yoshizawa

© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 9110", Proc. SPIE 9110, Dimensional Optical Metrology and Inspection for Practical Applications III, 911001 (12 June 2014);

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