1 May 2014 3D-optical measurement system using a new vignetting aperture procedure
Author Affiliations +
A newly developed measuring procedure uses vignetting to evaluate angles and angle changes, independently from the measurement distance. Further on, the same procedure enables the transmission of a digital readout and therefore a better automation of the electronic signal evaluation, for use as an alignment telescope. The fully extended readout by a simple 3-D reflector will provide the user with a measurement result with six degrees of freedom. The vignetting field stop procedure will be described. Firstly, considering artificial vignetting, the theoretical basics from geometric-optical view are represented. Secondly, the natural vignetting with photometric effects will be considered. The distribution of intensity in the image plane light spot, the so-called V-SPOT, is analytically deduced as a function of differently measured variables. Intensity shifts within the V-Spot are examined independently from different effects by numeric simulation. On these basics, the theoretical research regarding accuracy, linearity as well as results in 2 dimensional surface reconstruction on precision optical mirrors and also three dimensional measurements in mechanical engineering are examined. Effects and deviations will be discussed. The project WiPoVi is sponsored by “Ingenieur Nachwuchs – Qualifizierung von Ingenieurnachwuchs an Fachhochschulen” by Bavarian State Ministry of Education, Science and the Arts.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Engelbert Hofbauer, Engelbert Hofbauer, Rolf Rascher, Rolf Rascher, Konrad Wühr, Konrad Wühr, Felix Friedke, Felix Friedke, Thomas Stubenrauch, Thomas Stubenrauch, Benjamin Pastötter, Benjamin Pastötter, Sebastian Schleich, Sebastian Schleich, Christine Zöcke, Christine Zöcke, "3D-optical measurement system using a new vignetting aperture procedure", Proc. SPIE 9132, Optical Micro- and Nanometrology V, 913206 (1 May 2014); doi: 10.1117/12.2052631; https://doi.org/10.1117/12.2052631

Back to Top