Metrology of micro-optical components quality using direct measurement of 3D intensity point spread function

Maciej Baranski; Stephane Perrin; Nicolas Passilly; Luc Froehly; Sylwester Bargiel; Jorge Albero; Christophe Gorecki

doi:10.1117/12.2051122

1 May 2014 Metrology of micro-optical components quality using direct measurement of 3D intensity point spread function

Maciej Baranski, Stephane Perrin, Nicolas Passilly, Luc Froehly, Sylwester Bargiel, Jorge Albero, Christophe Gorecki

Proceedings Volume 9132, Optical Micro- and Nanometrology V; 913216 (2014) https://doi.org/10.1117/12.2051122
Event: SPIE Photonics Europe, 2014, Brussels, Belgium

Abstract

High-resolution miniature imaging systems require high quality micro-optical elements. Therefore, it is essential to characterize their optical performances in order to optimize their fabrication. Usually, basic evaluation of micro-optical elements quality is based on the measurement of their topography since their optical properties are largely defined by their shape. However, optical characteristics have to be derived from the measured geometry. An alternative method is the direct measurement of their optical properties. Unlike topography measurement, it allows characterization of high numerical aperture components. Moreover, it can be applied to single elements but also to optical systems composed of several micro-optical components. In this work, we propose a simple method based on the measurement of the 3D intensity point spread function (IPSF). IPSF is defined by the 3D shape of the focal spot generated by the micro-element. The direct characterization of focusing response through the measurement of IPSF allows very precise estimation of micro-structures quality. The considered method consists in imaging different slices of the focal volume generated by the focusing component. It allows, depending on the configuration, characterizing both transmissive and reflective micro-optical components.

Citation Download Citation

Maciej Baranski, Stephane Perrin, Nicolas Passilly, Luc Froehly, Sylwester Bargiel, Jorge Albero, and Christophe Gorecki "Metrology of micro-optical components quality using direct measurement of 3D intensity point spread function", Proc. SPIE 9132, Optical Micro- and Nanometrology V, 913216 (1 May 2014); https://doi.org/10.1117/12.2051122

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KEYWORDS

3D metrology

Optical components

Imaging systems

Objectives

Microscopes

Point spread functions

Cameras

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