1 May 2014 High-frequency sub-wavelength IR thermal source
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Abstract
We present a method to characterize the temperature dynamics of miniaturized thermal IR sources. The method circumvents the limitations of current IR photodetectors, by relying only on an electrical measurement rather than on optical detection. Thus, it enables the characterization of the light emission of IR sources over their full operation frequency range. Moreover, we develop a model of thermal IR sources allowing simulations of their thermal and electrical behavior. By combining measurements and modeling, we achieve a comprehensive characterization of a Pt nanowire IR source: the reference resistance R0 = 17.7Ω, the TCR α = 2.0 × 10-3 K-1, the thermal mass C = 2.7 × 10-14 J/K, and the thermal conductance G = 1.3 × 10-6 W/K. The thermal time constant could not be measured, because of the frequency limitation of our setup. However, the operation of the source has been tested and proved to function up to 1 MHz, indicating that the thermal time constant of the source is smaller than 1 μs.
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Floria Ottonello Briano, Floria Ottonello Briano, Pauline Renoux, Pauline Renoux, Fredrik Forsberg, Fredrik Forsberg, Hans Sohlström, Hans Sohlström, Snorri Ingvarsson, Snorri Ingvarsson, Göran Stemme, Göran Stemme, Kristinn B. Gylfason, Kristinn B. Gylfason, } "High-frequency sub-wavelength IR thermal source", Proc. SPIE 9133, Silicon Photonics and Photonic Integrated Circuits IV, 91331D (1 May 2014); doi: 10.1117/12.2052457; https://doi.org/10.1117/12.2052457
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