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1 May 2014 Electrical and electro-optic characterization of nonlinear polymer thin films on silicon substrate
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Abstract
In this paper we present electrical and electro-optical (EO) measurements of polymer thin films on silicon substrates. A method is presented on how to interpret ellipsometric measurements of the (EO) coefficient on silicon substrate by taking into account multiple reflections in each sample layer. The obtained EO coefficients on silicon substrate are compared to measurements for indium tin oxide (ITO) coated glass substrates. Electrical measurements are performed to analyze the conduction mechanisms inside the polymer film. Based on the presented experimental data different models are discussed in order to explain the differences in current density during poling between ITO coated glass substrates and silicon substrates.
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Stefan Prorok, Marvin Schulz, Alexander Petrov, Manfred Eich, Jingdong Luo, and Alex K.-Y. Jen "Electrical and electro-optic characterization of nonlinear polymer thin films on silicon substrate", Proc. SPIE 9137, Organic Photonics VI, 91371H (1 May 2014); https://doi.org/10.1117/12.2052616
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