24 July 2014 The Canadian Astro-H Metrology System
Author Affiliations +
The Hard X-ray Telescopes on Astro-H have a 12-meter focal length. In order to achieve this long focal length and still fit compactly in the H-IIA launch fairing, the detectors are mounted at the end of an extendable optical bench that will be deployed in orbit. Once in operation, the spacecraft will experience distortions primarily due to thermal fluctuations in low-earth orbit and it is important that the misalignment between the telescopes and instruments is accurately measured. The Canadian Astro-H Metrology System (CAMS) is a laser alignment system that will measure optical alignment deviations. The CAMS is compact, consumes little power, and is stable over a wide temperature range. The system will be used to measure lateral (X/Y) displacement as well as rotational shifts in the optical bench. In addition, the CAMS data can be used to enhance the quality of the hard X-ray images that will have been degraded by structural deformations. A description of the CAMS hardware and the relevant data processing algorithms are provided.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Luigi Gallo, Luigi Gallo, Casey Lambert, Casey Lambert, Alex Koujelev, Alex Koujelev, Stephane Gagnon, Stephane Gagnon, Martin Guibert, Martin Guibert, } "The Canadian Astro-H Metrology System", Proc. SPIE 9144, Space Telescopes and Instrumentation 2014: Ultraviolet to Gamma Ray, 914456 (24 July 2014); doi: 10.1117/12.2054921; https://doi.org/10.1117/12.2054921


Flight production of Caliste SO the hard x ray...
Proceedings of SPIE (July 17 2016)
A ground calibration of the engineering model of the SXT...
Proceedings of SPIE (September 26 2012)
Hard x ray characterization of the NeXT hard x ray...
Proceedings of SPIE (July 14 2008)
The Canadian Astro-H metrology system
Proceedings of SPIE (September 16 2012)
SWIFT BAT calibration and the estimated BAT hard x ray...
Proceedings of SPIE (February 02 2004)
Performance of the InFOCμS pixellated CdZnTe detector
Proceedings of SPIE (August 17 2005)

Back to Top