Early attempts to extend staring-mode sensing into the thermal infrared spectrum failed, because the resulting imagery was dominated by fixed pattern noise. The source of this noise was modulation of the infrared background by sensor response non-uniformities. In 1973, use of internal photoemission from Schottky silicide arrays was proposed as a means of achieving the photoresponse uniformity necessary to obtain useful thermal imaging capability. Since that time, there has been a steady evolution in silicide sensor technology. Current silicide cameras have sensitivity comparable with the best scanning systems. These cameras are based upon the largest infrared arrays now available. This paper will describe recent advances in silicide sensors and project future technology trends.