4 August 2014 Integrated Logistics Support approach: concept for the new big projects: E-ELT, SKA, CTA
Author Affiliations +
The Integrated Logistic Support is a process supporting strategies and optimizing activities for a correct project management and system engineering development. From the design & engineering of complex technical systems, to the erection on site, acceptance and after-sales service, EIE GROUP covers all aspects of the Integrated Logistics Support (ILS) process that includes: costing process centered around the life cycle cost and Level of Repair Analyses; engineering process which influences the design via means of reliability, modularization, etc.; technical publishing process based on international specifications; ordering administration process for supply support. Through the ILS, EIE GROUP plans and directs the identification and development of logistics support and system requirements for its products, with the goal of creating systems that last longer and require less support, thereby reducing costs and increasing return on investments. ILS therefore, addresses these aspects of supportability not only during acquisition, but also throughout the operational life cycle of the system. The impact of the ILS is often measured in terms of metrics such as reliability, availability, maintainability and testability (RAMT), and System Safety (RAMS). Example of the criteria and approach adopted by EIE GROUP during the design, manufacturing and test of the ALMA European Antennas and during the design phase of the E-ELT telescope and Dome are presented.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. Marchiori, G. Marchiori, F. Rampini, F. Rampini, F. Formentin, F. Formentin, "Integrated Logistics Support approach: concept for the new big projects: E-ELT, SKA, CTA", Proc. SPIE 9150, Modeling, Systems Engineering, and Project Management for Astronomy VI, 915008 (4 August 2014); doi: 10.1117/12.2057606; https://doi.org/10.1117/12.2057606

Back to Top