18 July 2014 Phase measuring deflectometry for thin actuated mirrors
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In the development of thin active mirrors for future x-ray telescopes there is a need for full field, non-null methods of rapidly characterising highly distorted surfaces without contact. Phase measuring deflectometry, due to its high dynamic range and flexibility, is a promising solution to this problem. In this paper is described a system developed by the authors at University College London, as well as the results of surface measurements using this methodology on thin sheets of actuated glass.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tom Catling, David Brooks, Peter Doel, "Phase measuring deflectometry for thin actuated mirrors", Proc. SPIE 9151, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation, 91510S (18 July 2014); doi: 10.1117/12.2056996; https://doi.org/10.1117/12.2056996


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