18 July 2014 Phase measuring deflectometry for thin actuated mirrors
Author Affiliations +
In the development of thin active mirrors for future x-ray telescopes there is a need for full field, non-null methods of rapidly characterising highly distorted surfaces without contact. Phase measuring deflectometry, due to its high dynamic range and flexibility, is a promising solution to this problem. In this paper is described a system developed by the authors at University College London, as well as the results of surface measurements using this methodology on thin sheets of actuated glass.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tom Catling, Tom Catling, David Brooks, David Brooks, Peter Doel, Peter Doel, } "Phase measuring deflectometry for thin actuated mirrors", Proc. SPIE 9151, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation, 91510S (18 July 2014); doi: 10.1117/12.2056996; https://doi.org/10.1117/12.2056996


Light-weight glass mirror systems for future x-ray telescopes
Proceedings of SPIE (September 26 2013)
Iterative surface construction for blind deflectometry
Proceedings of SPIE (September 27 2016)
Education in optics in Canon
Proceedings of SPIE (October 13 1995)
A two dimensional phase-shifting method for deflectometry
Proceedings of SPIE (November 17 2008)

Back to Top