18 July 2014 Phase measuring deflectometry for thin actuated mirrors
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Abstract
In the development of thin active mirrors for future x-ray telescopes there is a need for full field, non-null methods of rapidly characterising highly distorted surfaces without contact. Phase measuring deflectometry, due to its high dynamic range and flexibility, is a promising solution to this problem. In this paper is described a system developed by the authors at University College London, as well as the results of surface measurements using this methodology on thin sheets of actuated glass.
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Tom Catling, David Brooks, Peter Doel, "Phase measuring deflectometry for thin actuated mirrors", Proc. SPIE 9151, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation, 91510S (18 July 2014); doi: 10.1117/12.2056996; https://doi.org/10.1117/12.2056996
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