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23 July 2014 Methodology for a sub-millimeter near-field beam pattern measurement system
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Here we present the methodology and initial results for a new near-field antenna radiation measurement system for submillimeter receivers. The system is based on a 4-port vector network analyzer with two synthesized sources. This method improves on similar systems employing this technique with the use of the network analyzer, which reduces the cost and complexity of the system. Furthermore, a single set of test equipment can analyze multiple receivers with different central frequencies; the frequency range of the system is limited by the output range of the network analyzer and/or the power output of the source signal. The amplitude and phase stability of the system in one configuration at 350 GHz was measured and found to be accurate enough to permit near field antenna measurements. The proper characterization of phase drifts across multiple test configurations demonstrates system reliability. These initial results will determine parameters necessary for implementing a near-field radiation pattern measurement of a Schottky diode receiver operating between 340-360 GHz.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kristina K. Davis, Chris Groppi, Hamdi Mani, Caleb Wheeler, and Chris Walker "Methodology for a sub-millimeter near-field beam pattern measurement system", Proc. SPIE 9153, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VII, 91533F (23 July 2014);

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