23 July 2014 Measurement of pixel response functions of a fully depleted CCD
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We describe the measurement of detailed and precise Pixel Response Functions (PRFs) of a fully depleted CCD. Measurements were performed under different physical conditions, such as different wavelength light sources or CCD operating temperatures. We determined the relations between these physical conditions and the forms of the PRF. We employ two types of PRFs: one is the model PRF (mPRF) that can represent the shape of a PRF with one characteristic parameter and the other is the simulated PRF (sPRF) that is the resultant PRF from simulating physical phenomena. By using measured, model, and simulated PRFs, we determined the relations between operational parameters and the PRFs. Using the obtained relations, we can now estimate a PRF under conditions that will be encountered during the course of Nano-JASMINE observations. These estimated PRFs will be utilized in the analysis of the Nano-JASMINE data.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yukiyasu Kobayashi, Yukiyasu Kobayashi, Yoshito Niwa, Yoshito Niwa, Taihei Yano, Taihei Yano, Naoteru Gouda, Naoteru Gouda, Takuji Hara, Takuji Hara, Yoshiyuki Yamada, Yoshiyuki Yamada, } "Measurement of pixel response functions of a fully depleted CCD", Proc. SPIE 9154, High Energy, Optical, and Infrared Detectors for Astronomy VI, 91541W (23 July 2014); doi: 10.1117/12.2055582; https://doi.org/10.1117/12.2055582


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