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The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from this book: Author(s), “Title of Paper,” in Reliability of Photovoltaic Cells, Modules, Components, and Systems VII, edited by Neelkanth G. Dhere, John H. Wohlgemuth, Rebecca Jones-Albertus, Proceedings of SPIE Vol. 9179 (SPIE, Bellingham, WA, 2014) Article CID Number. ISSN: 0277-786X ISBN: 9781628412062 Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time)· Fax +1 360 647 1445 Copyright © 2014, Society of Photo-Optical Instrumentation Engineers. Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/14/$18.00. Printed in the United States of America. Publication of record for individual papers is online in the SPIE Digital Library. Paper Numbering: Proceedings of SPIE follow an e-First publication model, with papers published first online and then in print and on CD-ROM. Papers are published as they are submitted and meet publication criteria. A unique, consistent, permanent citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a six-digit CID article numbering system in which:
The CID Number appears on each page of the manuscript. The complete citation is used on the first page, and an abbreviated version on subsequent pages. Numbers in the index correspond to the last two digits of the six-digit CID Number. AuthorsNumbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc. Abramson, Alexis R., 0J Ashcroft, Ian, 0O Badiee, Amir, 0O Barreau, Nicolas, 0I, 0K Biggie, R., 08 Boppana, S., 0D Bradley, Alexander Z., 07, 0P Brooker, R. Paul, 0Y Chung, Simon, xix Conibeer, Gavin, xix Dai, Xi, xix Dasgupta, Supratik, 0K Daume, Felix, 0I Davis, Kristopher O., 0Y Dhere, Neelkanth G., 06, 0C, 0F, 0H, 0Q, 0Y Duggal, Anil R., xi Felder, Thomas C., 0P Feng, Yu, xix Fonseca, Leandro C., 06 Fortuno, Z. D., 0U Foster, Christopher, 0K French, Roger H., 0J, 0P Fu, Oakland, 0P Fujikake, Shinji, 05 Gade, Vivek, 0C, 0H Gambogi, William J., 07, 0P Gok, Abdulkerim, 0P Gu, Xiaohong, 0R Gupta, Neeti, xix Hamzavytehrany, Babak, 07, 0P Hans, Vincent, 0I Hardikar, Kedar, 0N Hossain, Mohammad A., 0J Hu, Hongjie, 0P Huang, Shujuan, xix Huang, W.-J., 08, 0U Huber, William H., xi Ji, Liang, 0J John, J., 0D Kalejs, Juris, 0S Kessler, Bill, 09 Kopchick, James G., 0P Krajewski, Todd, 0N Krommenhoek, Peter J., 0R Kurtz, Sarah, 02 Lai, T., 08 Li, M., 0U Liakopoulou, Aikaterini, 0I Liao, H., 0U Liao, Yuanxun, xix Lin, Chiao-Chi, 0R Lin, Shu, xix Liu, J., 0U Mohajeri, Nahid, 0Y Nakamura, Tetsuro, 05 Nishihara, Hironori, 05 Patterson, Robert, xix Peacock, R. Scott, 0P Pereira, Camila L., 06 Peshek, Timothy J., 0J Phillips, Nancy H., 0L Potter, B. G., Jr., 08, 0U Rajasekar, V., 0D Robusto, Paul F., 09, 0H Rodgers, Marianne P., 0Y Rudack, Andrew C., 0Y Rusch, Peter, 0X Sakai, Toshiaki, 05 Sakurai, Keiichiro, 05 Saproo, Ajay, 09, 0N Scardera, Giuseppe, 0Y Schleith, Susan, 0F Schneller, Eric, 06, 0C, 0Q, 0Y Schoenfeld, Winston V., 0Y Scott, Kurt P., 0L Seigneur, Hubert, 0Y Shiradkar, Narendra S., 06, 0C, 0H, 0Q, 0Y Shrestha, Santosh, xix Simmons-Potter, K., 08, 0U Smyth, Suntrana, xix Steijvers, Henk, 0I Stika, Katherine M., 0P Sun, Jiayang, 0J Takani, Masayoshi, 05 Takano, Akihiro, 05 Tamizhmani, G., 0D Tatapudi, S., 0D Tayebjee, Murad, xix Theelen, Mirjam, 0I, 0K Toivola, Kristopher, 09 Trout, T. John, 0P Uchida, Yasunori, 0H Vitkavage, Dan, 0N Vroon, Zeger, 0I, 0K Walters, Joseph, 0Y Wang, Pei, xix Watson, Stephanie S., 0R Whitfield, Kent, 0H Wildman, Ricky, 0O Wohlgemuth, John, 02, 0H, 0Y Xia, Hongze, xix Xu, Yifan, 0J Yanase, Hironori, 05 Zeman, Miro, 0I, 0K Zhang, Pengfei, xix Zhang, Zhilong, xix Conference CommitteeSymposium Chair Conference Chair Conference Co-chairs
Conference Program Committee
Session Chairs
IntroductionThis year’s conference on Reliability of Photovoltaic Cells, Modules, Components, and Systems VII, as a part of the SPIE Solar Energy and Technology meeting, was a great success. There were a number of excellent presentations from organizations around the world, with international participation from the United States, Japan, Germany, Netherlands, France, United Kingdom, and Spain. The conference participants came from a diverse background including universities, national laboratories, photovoltaic industry, and project finance. The friendly and intimate atmosphere allowed for several interactive group discussions that addressed a number of pressing issues involving photovoltaic module reliability. The sessions included presentations on photovoltaic module testing and characterization, simulation and modeling, reliability of modules and components, packaging materials and encapsulation, and quality management tools. A common topic in this conference was regarding the efforts of the International Photovoltaic Quality Assurance Task Force (PVQAT) in addressing the needs for module qualification protocols and lifetime predictions of photovoltaic module performance. A number of research groups presented on the performance of modules and systems both under accelerated conditions and in the field. Additional highlights include the research and development related to module packaging materials and components such as encapsulants, backsheets, junction boxes, bypass diodes, and micro-inverters. Finally, efforts in the approaches to quality assurance during module manufacturing were presented. The conference ended with an interactive panel discussion involving seasoned experts in photovoltaic module reliability in which current challenges and opportunity for research and development were discussed. This was a great opportunity for all attendees to get involved in the discussions, make comments and ask questions that addressed a wide variety of issues affecting photovoltaic reliability. On behalf of the conference organizing committee, we would like to thank all attendees and presenters for their outstanding work and engaging discussions. We look forward to your continued support and participation in next year’s conference. Neelkanth G. Dhere John H. Wohlgemuth Rebecca Jones-Albertus |
