11 November 2014 Front Matter: Volume 9179
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 9179, including the Title Page, Copyright information, Table of Contents, Authors, Introduction, and Conference Committee listing.

The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from this book:

Author(s), “Title of Paper,” in Reliability of Photovoltaic Cells, Modules, Components, and Systems VII, edited by Neelkanth G. Dhere, John H. Wohlgemuth, Rebecca Jones-Albertus, Proceedings of SPIE Vol. 9179 (SPIE, Bellingham, WA, 2014) Article CID Number.

ISSN: 0277-786X

ISBN: 9781628412062

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Authors

Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Abramson, Alexis R., 0J

Ashcroft, Ian, 0O

Badiee, Amir, 0O

Barreau, Nicolas, 0I, 0K

Biggie, R., 08

Boppana, S., 0D

Bradley, Alexander Z., 07, 0P

Brooker, R. Paul, 0Y

Chung, Simon, xix

Conibeer, Gavin, xix

Dai, Xi, xix

Dasgupta, Supratik, 0K

Daume, Felix, 0I

Davis, Kristopher O., 0Y

Dhere, Neelkanth G., 06, 0C, 0F, 0H, 0Q, 0Y

Duggal, Anil R., xi

Felder, Thomas C., 0P

Feng, Yu, xix

Fonseca, Leandro C., 06

Fortuno, Z. D., 0U

Foster, Christopher, 0K

French, Roger H., 0J, 0P

Fu, Oakland, 0P

Fujikake, Shinji, 05

Gade, Vivek, 0C, 0H

Gambogi, William J., 07, 0P

Gok, Abdulkerim, 0P

Gu, Xiaohong, 0R

Gupta, Neeti, xix

Hamzavytehrany, Babak, 07, 0P

Hans, Vincent, 0I

Hardikar, Kedar, 0N

Hossain, Mohammad A., 0J

Hu, Hongjie, 0P

Huang, Shujuan, xix

Huang, W.-J., 08, 0U

Huber, William H., xi

Ji, Liang, 0J

John, J., 0D

Kalejs, Juris, 0S

Kessler, Bill, 09

Kopchick, James G., 0P

Krajewski, Todd, 0N

Krommenhoek, Peter J., 0R

Kurtz, Sarah, 02

Lai, T., 08

Li, M., 0U

Liakopoulou, Aikaterini, 0I

Liao, H., 0U

Liao, Yuanxun, xix

Lin, Chiao-Chi, 0R

Lin, Shu, xix

Liu, J., 0U

Mohajeri, Nahid, 0Y

Nakamura, Tetsuro, 05

Nishihara, Hironori, 05

Patterson, Robert, xix

Peacock, R. Scott, 0P

Pereira, Camila L., 06

Peshek, Timothy J., 0J

Phillips, Nancy H., 0L

Potter, B. G., Jr., 08, 0U

Rajasekar, V., 0D

Robusto, Paul F., 09, 0H

Rodgers, Marianne P., 0Y

Rudack, Andrew C., 0Y

Rusch, Peter, 0X

Sakai, Toshiaki, 05

Sakurai, Keiichiro, 05

Saproo, Ajay, 09, 0N

Scardera, Giuseppe, 0Y

Schleith, Susan, 0F

Schneller, Eric, 06, 0C, 0Q, 0Y

Schoenfeld, Winston V., 0Y

Scott, Kurt P., 0L

Seigneur, Hubert, 0Y

Shiradkar, Narendra S., 06, 0C, 0H, 0Q, 0Y

Shrestha, Santosh, xix

Simmons-Potter, K., 08, 0U

Smyth, Suntrana, xix

Steijvers, Henk, 0I

Stika, Katherine M., 0P

Sun, Jiayang, 0J

Takani, Masayoshi, 05

Takano, Akihiro, 05

Tamizhmani, G., 0D

Tatapudi, S., 0D

Tayebjee, Murad, xix

Theelen, Mirjam, 0I, 0K

Toivola, Kristopher, 09

Trout, T. John, 0P

Uchida, Yasunori, 0H

Vitkavage, Dan, 0N

Vroon, Zeger, 0I, 0K

Walters, Joseph, 0Y

Wang, Pei, xix

Watson, Stephanie S., 0R

Whitfield, Kent, 0H

Wildman, Ricky, 0O

Wohlgemuth, John, 02, 0H, 0Y

Xia, Hongze, xix

Xu, Yifan, 0J

Yanase, Hironori, 05

Zeman, Miro, 0I, 0K

Zhang, Pengfei, xix

Zhang, Zhilong, xix

Conference Committee

Symposium Chair

  • Oleg V. Sulima, GE Global Research (United States)

Conference Chair

  • Neelkanth G. Dhere, University of Central Florida (United States)

Conference Co-chairs

  • John H. Wohlgemuth, National Renewable Energy Laboratory (United States)

  • Rebecca Jones-Albertus, U.S. Department of Energy (United States)

Conference Program Committee

  • David S. Albin, National Renewable Energy Laboratory (United States)

  • Glenn Alers, University of California, Santa Cruz (United States)

  • Ward I. Bower, Sandia National Laboratories (United States)

  • Leila R. O. Cruz, Instituto Militar de Engenharia (Brazil)

  • Takuya Doi, National Institute of Advanced Industrial Science and Technology (Japan)

  • Fernando Fabero, Centro de Investigaciones Energéticas, Medioambientales y Tecnológicas (Spain)

  • Vivek S. Gade, Jabil Circuit, Inc. (United States)

  • William J. Gambogi Jr., DuPont (United States)

  • Werner Herrmann, TÜV Rheinland Group (Germany)

  • Stephen J. Hogan, Spire Corporation (United States)

  • Michael Köhl, Fraunhofer-Institut für Solare Energiesysteme (Germany)

  • Ralf Leutz, Concentrator Optics GmbH (Germany)

  • Xavier Mathew, Centro de Investigación en Energia (Mexico)

  • Robert McConnell, Arzon Solar, LLC (United States)

  • Yoichi Murakami, Japan Electrical Safety & Environment Technology Laboratories (Japan)

  • F. J. John Pern, Sunshine Sci-Tech LLC (United States)

  • Laure-Emmanuelle Perret-Aebi, Ecole Polytechnique Fédérale de Lausanne (Switzerland)

  • Shirish Pethe, Applied Materials, Inc. (United States)

  • Marianne Rodgers, University of Central Florida (United States)

  • Ivan Sinicco, Oerlikon Solar Ltd. (Switzerland)

  • Oleg V. Sulima, GE Global Research (United States)

  • Bolko von Roedern, von Roedern & Associates LLC (United States)

Session Chairs

  • PV Module Testing

    Nancy Phillips, 3M Company (United States)

  • PV Module Reliability: Simulation and Modeling

    Michael D. Kempe, National Renewable Energy Laboratory (United States)

  • Reliability of PV Cells, Modules, Systems and Components I

    John H. Wohlgemuth, National Renewable Energy Laboratory (United States)

  • Encapsulant, Backsheet, and Packaging Materials

    Michael Köhl, Fraunhofer-Institut für Solare Energiesysteme (Germany)

  • Reliability of PV Cells, Modules, Systems, and Components II

    John H. Wohlgemuth, National Renewable Energy Laboratory (United States)

  • Metrology and Quality Management Tools for Improved Reliability

    Neelkanth G. Dhere, University of Central Florida (United States)

Introduction

This year’s conference on Reliability of Photovoltaic Cells, Modules, Components, and Systems VII, as a part of the SPIE Solar Energy and Technology meeting, was a great success. There were a number of excellent presentations from organizations around the world, with international participation from the United States, Japan, Germany, Netherlands, France, United Kingdom, and Spain. The conference participants came from a diverse background including universities, national laboratories, photovoltaic industry, and project finance. The friendly and intimate atmosphere allowed for several interactive group discussions that addressed a number of pressing issues involving photovoltaic module reliability.

The sessions included presentations on photovoltaic module testing and characterization, simulation and modeling, reliability of modules and components, packaging materials and encapsulation, and quality management tools. A common topic in this conference was regarding the efforts of the International Photovoltaic Quality Assurance Task Force (PVQAT) in addressing the needs for module qualification protocols and lifetime predictions of photovoltaic module performance. A number of research groups presented on the performance of modules and systems both under accelerated conditions and in the field. Additional highlights include the research and development related to module packaging materials and components such as encapsulants, backsheets, junction boxes, bypass diodes, and micro-inverters. Finally, efforts in the approaches to quality assurance during module manufacturing were presented.

The conference ended with an interactive panel discussion involving seasoned experts in photovoltaic module reliability in which current challenges and opportunity for research and development were discussed. This was a great opportunity for all attendees to get involved in the discussions, make comments and ask questions that addressed a wide variety of issues affecting photovoltaic reliability. On behalf of the conference organizing committee, we would like to thank all attendees and presenters for their outstanding work and engaging discussions. We look forward to your continued support and participation in next year’s conference.

Neelkanth G. Dhere

John H. Wohlgemuth

Rebecca Jones-Albertus

© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 9179", Proc. SPIE 9179, Reliability of Photovoltaic Cells, Modules, Components, and Systems VII, 917901 (11 November 2014); doi: 10.1117/12.2176643; https://doi.org/10.1117/12.2176643
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