8 October 2014 Research, test, and development activities performed by junction box bypass diode task force # 4
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Abstract
The paper provides latest update on the activities performed by the group #4-diodes, shading and reverse bias of the PV Module Quality Assurance Task Force (PVQAT) in the areas such as electrostatic discharge testing and standards, thermal runaway testing, diode junction temperature measurement techniques, thermal endurance tests and analysis of field failures. Philosophy, motivation and future direction for the group #4 is also discussed.
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Vivek Gade, Narendra Shiradkar, Paul Robusto, Kent Whitfield, John Wohlgemuth, Yasunori Uchida, Neelkanth G. Dhere, "Research, test, and development activities performed by junction box bypass diode task force # 4", Proc. SPIE 9179, Reliability of Photovoltaic Cells, Modules, Components, and Systems VII, 91790H (8 October 2014); doi: 10.1117/12.2062195; https://doi.org/10.1117/12.2062195
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