Optical method for making spatially and temporally resolved measurements of the hole concentration in organic electrochemical transistors

Jacob T. Friedlein; Sean E. Shaheen; Robert R. McLeod

doi:10.1117/12.2063564

7 October 2014 Optical method for making spatially and temporally resolved measurements of the hole concentration in organic electrochemical transistors

Jacob T. Friedlein, Sean E. Shaheen, Robert R. McLeod

Author Affiliations +

Proceedings Volume 9185, Organic Field-Effect Transistors XIII; and Organic Semiconductors in Sensors and Bioelectronics VII; 91851X (2014) https://doi.org/10.1117/12.2063564
Event: SPIE Organic Photonics + Electronics, 2014, San Diego, California, United States

Abstract

Electrochemical reduction and oxidation of PEDOT:PSS are used to modulate the channel current in organic electrochemical transistors (OECTs). In addition to changing PEDOT conductivity over more than 4 orders of magnitude, these redox reactions cause a shift in the PEDOT:PSS absorption spectrum. In this work we have used this shift in the absorption spectrum to make spatially and temporally resolved measurements of the redox state of PEDOT:PSS. By applying these measurements to the PEDOT:PSS in an OECT channel, we have shown that the redox state of the PEDOT:PSS is not constant along the channel during transistor operation. Furthermore, we have shown that the time constant of the optical transition is significantly larger near the transistor source than it is near the transistor drain. These results are not considered in existing models of the OECT transient response, and they may lead to a better understanding of geometry-performance relationships in OECTs.

Citation Download Citation

Jacob T. Friedlein, Sean E. Shaheen, and Robert R. McLeod "Optical method for making spatially and temporally resolved measurements of the hole concentration in organic electrochemical transistors", Proc. SPIE 9185, Organic Field-Effect Transistors XIII; and Organic Semiconductors in Sensors and Bioelectronics VII, 91851X (7 October 2014); https://doi.org/10.1117/12.2063564

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