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18 September 2014 A new lifetime estimation model for a quicker LED reliability prediction
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Abstract
LED reliability and lifetime prediction is a key point for Solid State Lighting adoption. For this purpose, one hundred and fifty LEDs have been aged for a reliability analysis. LEDs have been grouped following nine current-temperature stress conditions. Stress driving current was fixed between 350mA and 1A and ambient temperature between 85C and 120°C. Using integrating sphere and I(V) measurements, a cross study of the evolution of electrical and optical characteristics has been done. Results show two main failure mechanisms regarding lumen maintenance. The first one is the typically observed lumen depreciation and the second one is a much more quicker depreciation related to an increase of the leakage and non radiative currents. Models of the typical lumen depreciation and leakage resistance depreciation have been made using electrical and optical measurements during the aging tests. The combination of those models allows a new method toward a quicker LED lifetime prediction. These two models have been used for lifetime predictions for LEDs.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. H. Hamon, L. Mendizabal, G. Feuillet, A. Gasse, and B. Bataillou "A new lifetime estimation model for a quicker LED reliability prediction", Proc. SPIE 9190, Thirteenth International Conference on Solid State Lighting, 919007 (18 September 2014); https://doi.org/10.1117/12.2060791
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