5 September 2014 High brightness electron sources for MeV ultrafast diffraction and microscopy
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Abstract
In this paper we review the present status of MeV electron sources for ultrafast diffraction and microscopy applications and trace the path forward to improve the spatio-temporal resolution of electron scattering probes.
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P. Musumeci, P. Musumeci, R. K. Li, R. K. Li, } "High brightness electron sources for MeV ultrafast diffraction and microscopy", Proc. SPIE 9198, Ultrafast Nonlinear Imaging and Spectroscopy II, 91980S (5 September 2014); doi: 10.1117/12.2062997; https://doi.org/10.1117/12.2062997
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