18 August 2014 Front Matter: Volume 9204
This PDF file contains the front matter associated with SPIE Proceedings Volume 9204 including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.

The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from this book:

Author(s), “Title of Paper,” in Interferometry XVII: Advanced Applications, edited by Cosme Furlong, Christophe Gorecki, Peter J. de Groot, Erik L. Novak, Proceedings of SPIE Vol. 9204 (SPIE, Bellingham, WA, 2014) Article CID Number.

ISSN: 0277-786X

ISBN: 9781628412314

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Conference Committee

Program Track Chairs

José Sasián, College of Optical Sciences, The Univ. of Arizona (United States)

R. John Koshel, Photon Engineering LLC (United States) and College of Optical Sciences, The Univ. of Arizona (United States)

Conference Chairs

Cosme Furlong, Worcester Polytechnic Institute (United States)

Christophe Gorecki, FEMTO-ST (France)

Peter J. de Groot, Zygo Corporation (United States)

Erik L. Novak, 4D Technology Corporation (United States)

Conference Program Committee

Armando Albertazzi Gonçalves Jr., Universidade Federal de Santa Catarina (Brazil)

Anand K. Asundi, Nanyang Technological University (Singapore)

Ralf B. Bergmann, Bremer Institut für angewandte Strahltechnik GmbH (Germany)

Katherine Creath, Optineering (United States) and The University of Arizona (United States)

Konstantinos Falaggis, Warsaw University of Technology (Poland)

Claas Falldorf, Bremer Institut für angewandte Strahltechnik GmbH (Germany)

Ángel M. Fernandez Doval, Universidade de Vigo (Spain)

Pietro Ferraro, Istituto Nazionale di Ottica (Italy)

Mauricio Flores Moreno, Centro de Investigaciones en Óptica, A.C. (Mexico)

Motoharu Fujigaki, Wakayama University (Japan)

James G. Fujimoto, Massachusetts Institute of Technology (United States)

Daniel R. Guildenbecher, Sandia National Laboratories (United States)

Bradley T. Kimbrough, 4D Technology Corporation (United States)

Małgorzata Kujawińska, Warsaw University of Technology (Poland)

Fernando Mendoza Santoyo, Centro de Investigaciones en Óptica, A.C. (Mexico)

Gunther Notni, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

Wolfgang Osten, Institut für Technische Optik (Germany)

Ryszard J. Pryputniewicz, Worcester Polytechnic Institute (United States)

Christian Rembe, Polytec GmbH (Germany)

Mikael Sjödahl, Luleå University of Technology (Sweden)

Pierre R. L. Slangen, Mines Alès (France)

James D. Trolinger, MetroLaser, Inc. (United States)

Rainer Tutsch, Technische Universität Braunschweig (Germany)

Wei-Chung Wang, National Tsing Hua University (Taiwan)

James C. Wyant, College of Optical Sciences, The University of Arizona (United States)

Session Chairs

  • 1 Life Science Applications

    Cosme Furlong, Worcester Polytechnic Institute (United States)

  • 2 Surface Shape and Form

    Erik L. Novak, 4D Technology Corporation (United States)

  • 3 Novel Methods and Applications

    Christophe Gorecki, FEMTO-ST (France)

  • 4 Industrial and Large-scale Metrology

    Peter J. de Groot, Zygo Corporation (United States)

© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 9204", Proc. SPIE 9204, Interferometry XVII: Advanced Applications, 920401 (18 August 2014); doi: 10.1117/12.2076055; https://doi.org/10.1117/12.2076055

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