18 August 2014 Dynamic shape measurements of rough surface with a two wavelength method
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Abstract
Digital Speckle Pattern Interferometry (DSPI) has been applied to measure shape of solid rough objects. A two wavelength setup with one single recording has been applied. Spatial Phase Shifting techniques, with different carrier fringes for each wavelength, have been used in order to produce a spatial multiplex. Selecting each aperture image in the Fourier plane, the amplitude and the phase of the object beam is obtained for each wavelength. The subtraction of those waves produces a wrapped phase map that can be considered a contour line map for a synthetic wavelength. The technique has been applied in different material and the visibility of the fringes is observed. The possibilities and limits of the technique have been analyzed.
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N. Andrés, L. A. Arévalo-Díaz, J. A. Lorda, V. Palero, J. Lobera, M. P. Arroyo, "Dynamic shape measurements of rough surface with a two wavelength method", Proc. SPIE 9204, Interferometry XVII: Advanced Applications, 92040B (18 August 2014); doi: 10.1117/12.2061889; https://doi.org/10.1117/12.2061889
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