18 August 2014 Dynamic temperature field measurements using a polarization phase shifting technique
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Abstract
An optical system capable of simultaneously grabbing three phase-shifted interferometric images was developed for dynamic temperature field measurements outside of a thin flame. The polarization phase shifting technique and a Michelson interferometer that is coupled to a 4-f system with a Ronchi grating placed at the frequency plane are used. This configuration permits the phase-shifted interferograms to be grabbed simultaneously by one CCD. The temperature field measurement is based on measuring the refraction index difference by solving the inverse Abel transform, which requires information obtained by the fringe order localization. Experimental results of a dynamic event are presented varying in time.
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David Ignacio Serrano-García, Amalia Martínez-García, Noel-Ivan Toto-Arellano, Yukitoshi Otani, "Dynamic temperature field measurements using a polarization phase shifting technique", Proc. SPIE 9204, Interferometry XVII: Advanced Applications, 92040E (18 August 2014); doi: 10.1117/12.2061840; https://doi.org/10.1117/12.2061840
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