5 September 2014 The inversion of inchoherent light scattering data to obtain statistical and optical properties of a two-dimensional randomly rough dielectric surface.
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Abstract
An approach to inverting experimental light scattering data for obtaining the normalized surface height autocorrelation function of a two-dimensional randomly rough dielectric surface, and its rms height is presented. It is based on the expression for the contribution to the mean differential reflection coefficient from the in-plane, co-polarized, light of s-polarization scattered diffusely from such a surface, obtained by phase perturbation theory. For weakly rough surfaces the reconstructions obtained by this approach are quite accurate.
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S. Chakrabarti, A. A. Maradudin, I. Simonsen, E. I. Chaikina, "The inversion of inchoherent light scattering data to obtain statistical and optical properties of a two-dimensional randomly rough dielectric surface.", Proc. SPIE 9205, Reflection, Scattering, and Diffraction from Surfaces IV, 920505 (5 September 2014); doi: 10.1117/12.2063608; https://doi.org/10.1117/12.2063608
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