5 September 2014 X-ray multilens interferometer based on Si refractive lenses
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Abstract
We report a multilens X-ray interferometer consisting of six parallel arrays of planar compound refractive lenses. The main concept of new interferometer is based on the same principle such a bilens interferometer. The interference fringe pattern produced by the multilens interferometer was described by Talbot imaging formalism. A theoretical analysis of the interference pattern formation was carried out and corresponding computer simulations were performed. The proposed multilens interferometer was experimentally tested at ID06 ESRF beamline in the X-ray energy range from 10 to 30 keV. Experimentally recorded fractional Talbot images are in a good agreement with computer calculations.
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A. Snigirev, I. Snigireva, M. Lyubomirskiy, V. Kohn, V. Yunkin, S. Kuznetsov, "X-ray multilens interferometer based on Si refractive lenses", Proc. SPIE 9207, Advances in X-Ray/EUV Optics and Components IX, 920703 (5 September 2014); doi: 10.1117/12.2061616; https://doi.org/10.1117/12.2061616
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