Specific aspects of roughness and interface diffusion in non-periodic Mo/Si multilayers

Stefan Braun; Peter Gawlitza; Maik Menzel; Wolfgang Friedrich; Jürgen Schmidt; Andreas Leson

doi:10.1117/12.2062193

17 September 2014 Specific aspects of roughness and interface diffusion in non-periodic Mo/Si multilayers

Stefan Braun, Peter Gawlitza, Maik Menzel, Wolfgang Friedrich, Jürgen Schmidt, Andreas Leson

Proceedings Volume 9207, Advances in X-Ray/EUV Optics and Components IX; 920707 (2014) https://doi.org/10.1117/12.2062193
Event: SPIE Optical Engineering + Applications, 2014, San Diego, California, United States

Abstract

Most of the currently used reflective coatings for EUV and X-ray mirrors are periodic nanometer multilayers. Depending on the number of periods and the absorption in the multilayer stack a certain band width of the incoming radiation can be reflected. In order to increase the integral reflectance or to accept larger ranges of incidence angles, non-periodic multilayers are needed. With the transition from periodic to non-periodic multilayers new challenges arise for the deposition process. Since the reflectance spectra are sensitive to every single layer thickness a precise coating control and an exact knowledge of the interface reactions are required. Furthermore substrate roughness influences the reflectance spectra. With an advanced coating process using additional ion bombardment during thin film growth the integrated reflectance of broadband mirrors can be conserved even for an initial substrate roughness of about 0.7 nm rms.

Citation Download Citation

Stefan Braun, Peter Gawlitza, Maik Menzel, Wolfgang Friedrich, Jürgen Schmidt, and Andreas Leson "Specific aspects of roughness and interface diffusion in non-periodic Mo/Si multilayers", Proc. SPIE 9207, Advances in X-Ray/EUV Optics and Components IX, 920707 (17 September 2014); https://doi.org/10.1117/12.2062193

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