5 September 2014 Phase delay characterization of multilayer coatings for FEL applications
Author Affiliations +
Abstract
The phase delay induced by multilayer (ML) mirrors is an important feature in many fields such as attosecond pulses compression, photolithography or in pump and probe experiments performed with Free Electron Laser (FEL) pulses. The experimental characterization of the ML phase delay can be obtained by the standing wave distribution measurement (by using Total Electron Yield (TEY) signal) combined to reflectance measurement. In this work, a ML structure with aperiodic capping-layers was designed and deposited for FEL applications and their reflectance and phase delay was characterized. The method adopted allows to retrieve the ML phase delay by using the TEY signals taken at different working configurations and it doesn’t require the comparison with a bulk reference sample. The results obtained are presented and discussed.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alain J. Corso, Enrico Tessarolo, Paola Zuppella, Sara Zuccon, Marco Nardello, Maria G. Pelizzo, "Phase delay characterization of multilayer coatings for FEL applications", Proc. SPIE 9207, Advances in X-Ray/EUV Optics and Components IX, 92070M (5 September 2014); doi: 10.1117/12.2061818; https://doi.org/10.1117/12.2061818
PROCEEDINGS
6 PAGES


SHARE
RELATED CONTENT

Multilayer coatings for free electron laser sources
Proceedings of SPIE (August 26 2015)
EUV/soft x-ray multilayer optics
Proceedings of SPIE (January 27 2005)
Ion beam sputter deposition of x ray multilayer optics on...
Proceedings of SPIE (September 11 2006)

Back to Top