5 September 2014 Characterization of thin HPHT IIa diamond by transmission and reflection measurements
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Abstract
X-ray transmission properties of a thin HPHT IIa diamond crystal were characterized around Bragg diffraction, using a pseudo plane-wave setup at the 1-km beamline of SPring-8. Monochromatic x-rays of 19.75 keV were used for diamond 400 reflection from 120-μm-thick (001) diamond crystals, and 9.44-keV x-rays were used for diamond 111 reflection from 180-μm-thick (111) crystals. These thin crystals were mounted on the aluminum plate using an ultraviolet-cured resin. Several thin crystals showed rocking curve broadening due to bend. However, by limiting a small area of the crystal, transmittance curves agreed well with those of calculation. We can select a practically usable region for various applications: phase retarder, beam splitter, and also self-seeding of x-ray free electron laser.
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Shunji Goto, Hiroshi Yamazaki, Ayumi Miura, Kenji Doi, Yuichi Inubushi, Haruhiko Ohashi, Makina Yabashi, "Characterization of thin HPHT IIa diamond by transmission and reflection measurements", Proc. SPIE 9207, Advances in X-Ray/EUV Optics and Components IX, 92070O (5 September 2014); doi: 10.1117/12.2063594; https://doi.org/10.1117/12.2063594
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