5 September 2014 Characterization of thin HPHT IIa diamond by transmission and reflection measurements
Author Affiliations +
X-ray transmission properties of a thin HPHT IIa diamond crystal were characterized around Bragg diffraction, using a pseudo plane-wave setup at the 1-km beamline of SPring-8. Monochromatic x-rays of 19.75 keV were used for diamond 400 reflection from 120-μm-thick (001) diamond crystals, and 9.44-keV x-rays were used for diamond 111 reflection from 180-μm-thick (111) crystals. These thin crystals were mounted on the aluminum plate using an ultraviolet-cured resin. Several thin crystals showed rocking curve broadening due to bend. However, by limiting a small area of the crystal, transmittance curves agreed well with those of calculation. We can select a practically usable region for various applications: phase retarder, beam splitter, and also self-seeding of x-ray free electron laser.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shunji Goto, Shunji Goto, Hiroshi Yamazaki, Hiroshi Yamazaki, Ayumi Miura, Ayumi Miura, Kenji Doi, Kenji Doi, Yuichi Inubushi, Yuichi Inubushi, Haruhiko Ohashi, Haruhiko Ohashi, Makina Yabashi, Makina Yabashi, "Characterization of thin HPHT IIa diamond by transmission and reflection measurements", Proc. SPIE 9207, Advances in X-Ray/EUV Optics and Components IX, 92070O (5 September 2014); doi: 10.1117/12.2063594; https://doi.org/10.1117/12.2063594

Back to Top