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17 September 2014Development of single grating x-ray Talbot interferometer as a feedback loop sensor element of an adaptive x-ray mirror system
Shashidhara Marathe,1 Xianbo Shihttps://orcid.org/0000-0002-1069-9981,1 Ali M. Khounsary,2,3 Michael J. Wojcik,1 Naresh G. Kujala,1 Albert T. Macrander,1 Lahsen Assoufid1
1Argonne National Lab. (United States) 2Illinois Institute of Technology (United States) 3X-Ray Optics, Inc. (United States)
The initial result of using a single 2-D checkerboard phase-grating Talbot interferometer as a feed-back loop sensor
element of an adaptive x-ray mirror system is reported. The test was performed by measuring the surface profile of a
deformable Pt coated Silicon mirror at five different actuation states. The reflected beam was detected at the fractional
Talbot distance of a π/2 phase grating. The measured interferograms were de-convolved using the spatial harmonic
imaging technique to extract the phase and amplitude of the reflected wavefront. The wavefront was then propagated to
the mirror center to retrieve the surface profile of the mirror. The activation of a single actuator was easily detected from
the reconstructed surface profile of the mirror. The presented results indicate that the single phase-grating x-ray Talbot
interferometer is capable of sensing nano-meter scale profile changes of an adaptive mirror.
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Shashidhara Marathe, Xianbo Shi, Ali M. Khounsary, Michael J. Wojcik, Naresh G. Kujala, Albert T. Macrander, Lahsen Assoufid, "Development of single grating x-ray Talbot interferometer as a feedback loop sensor element of an adaptive x-ray mirror system," Proc. SPIE 9208, Adaptive X-Ray Optics III, 92080D (17 September 2014); https://doi.org/10.1117/12.2062460