PROCEEDINGS VOLUME 9210
SPIE OPTICAL ENGINEERING + APPLICATIONS | 17-21 AUGUST 2014
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
IN THIS VOLUME

5 Sessions, 12 Papers, 0 Presentations
Optics II  (3)
Applications  (2)
Proceedings Volume 9210 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
17-21 August 2014
San Diego, California, United States
Front Matter: Volume 9210
Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 921001 (10 October 2014); doi: 10.1117/12.2084771
Diagnostics and Instrumentation I
Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 921002 (8 October 2014); doi: 10.1117/12.2061693
Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 921003 (10 October 2014); doi: 10.1117/12.2062980
Optics II
Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 921009 (8 October 2014); doi: 10.1117/12.2060238
Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100B (8 October 2014); doi: 10.1117/12.2061879
Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100D (8 October 2014); doi: 10.1117/12.2061087
Applications
Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100E (8 October 2014); doi: 10.1117/12.2061765
Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100I (8 October 2014); doi: 10.1117/12.2065257
Diagnostics and Instrumentation II
Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100J (8 October 2014); doi: 10.1117/12.2065252
Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100K (8 October 2014); doi: 10.1117/12.2062717
Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100L (17 September 2014); doi: 10.1117/12.2062567
Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100M (8 October 2014); doi: 10.1117/12.2069362
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