8 October 2014 Femtosecond-scale x-ray FEL diagnostics with the LCLS X-band transverse deflector
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Abstract
Analysis of single-shot, lasing-induced changes of the longitudinal electron bunch properties has proven invaluable for fs-scale reconstruction of otherwise difficult to measure x-ray FEL pulse profiles. In this talk, we report on measurements following the recent installation of an X-band transverse deflecting mode cavity at the LCLS. Limitations of the FEL pulse profiling technique employed are discussed. An unprecedented 1 to 3 fs RMS time resolution of x-ray and electron bunch profiles is demonstrated. Phenomena impacting x-ray FEL performance are also observed. The new tool is proven as a powerful diagnostic in support of user experiments and machine improvement studies.
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Timothy J. Maxwell, Christopher Behrens, Yuantao Ding, Zhirong Huang, Patrick Krejcik, Agostino Marinelli, Luciano Piccoli, Daniel Ratner, "Femtosecond-scale x-ray FEL diagnostics with the LCLS X-band transverse deflector", Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100J (8 October 2014); doi: 10.1117/12.2065252; https://doi.org/10.1117/12.2065252
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