Femtosecond-scale x-ray FEL diagnostics with the LCLS X-band transverse deflector

Timothy J. Maxwell; Christopher Behrens; Yuantao Ding; Zhirong Huang; Patrick Krejcik; Agostino Marinelli; Luciano Piccoli; Daniel Ratner

doi:10.1117/12.2065252

8 October 2014 Femtosecond-scale x-ray FEL diagnostics with the LCLS X-band transverse deflector

Timothy J. Maxwell, Christopher Behrens, Yuantao Ding, Zhirong Huang, Patrick Krejcik, Agostino Marinelli, Luciano Piccoli, Daniel Ratner

Author Affiliations +

Proceedings Volume 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II; 92100J (2014) https://doi.org/10.1117/12.2065252
Event: SPIE Optical Engineering + Applications, 2014, San Diego, California, United States

Abstract

Analysis of single-shot, lasing-induced changes of the longitudinal electron bunch properties has proven invaluable for fs-scale reconstruction of otherwise difficult to measure x-ray FEL pulse profiles. In this talk, we report on measurements following the recent installation of an X-band transverse deflecting mode cavity at the LCLS. Limitations of the FEL pulse profiling technique employed are discussed. An unprecedented 1 to 3 fs RMS time resolution of x-ray and electron bunch profiles is demonstrated. Phenomena impacting x-ray FEL performance are also observed. The new tool is proven as a powerful diagnostic in support of user experiments and machine improvement studies.

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Timothy J. Maxwell, Timothy J. Maxwell, Christopher Behrens, Christopher Behrens, Yuantao Ding, Yuantao Ding, Zhirong Huang, Zhirong Huang, Patrick Krejcik, Patrick Krejcik, Agostino Marinelli, Agostino Marinelli, Luciano Piccoli, Luciano Piccoli, Daniel Ratner, Daniel Ratner, "Femtosecond-scale x-ray FEL diagnostics with the LCLS X-band transverse deflector", Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100J (8 October 2014); doi: 10.1117/12.2065252; https://doi.org/10.1117/12.2065252

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