Paper
5 September 2014 Scintillator efficiency study with MeV x-rays
Stuart Baker, Kristina Brown, Alden Curtis, Stephen S. Lutz, Russell Howe, Robert Malone, Stephen Mitchell, Jeremy Danielson, Todd Haines, Kris Kwiatkowski
Author Affiliations +
Abstract
We have investigated scintillator efficiency for MeV radiographic imaging. This paper discusses the modeled detection efficiency and measured brightness of a number of scintillator materials. An optical imaging camera records images of scintillator emission excited by a pulsed x-ray machine. The efficiency of various thicknesses of monolithic LYSO:Ce (cerium-doped lutetium yttrium orthosilicate) are being studied to understand brightness and resolution trade-offs compared with a range of micro-columnar CsI:Tl (thallium-doped cesium iodide) scintillator screens. The micro-columnar scintillator structure apparently provides an optical gain mechanism that results in brighter signals from thinner samples. The trade-offs for brightness versus resolution in monolithic scintillators is straightforward. For higher-energy x-rays, thicker materials generally produce brighter signal due to x-ray absorption and the optical emission properties of the material. However, as scintillator thickness is increased, detector blur begins to dominate imaging system resolution due to the volume image generated in the scintillator thickness and the depth of field of the imaging system. We employ a telecentric optical relay lens to image the scintillator onto a recording CCD camera. The telecentric lens helps provide sharp focus through thicker-volume emitting scintillators. Stray light from scintillator emission can also affect the image scene contrast. We have applied an optical light scatter model to the imaging system to minimize scatter sources and maximize scene contrasts.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stuart Baker, Kristina Brown, Alden Curtis, Stephen S. Lutz, Russell Howe, Robert Malone, Stephen Mitchell, Jeremy Danielson, Todd Haines, and Kris Kwiatkowski "Scintillator efficiency study with MeV x-rays", Proc. SPIE 9213, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVI, 92130H (5 September 2014); https://doi.org/10.1117/12.2064028
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Scintillators

X-rays

Cameras

Imaging systems

Absorption

Signal to noise ratio

Sensors

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