FPGA implementation of 3D-displacement measurement based on 2D-DIC and FPP

Zhenkun Lei; Fangxu Zhang; Xuan Li

doi:10.1117/12.2069992

21 August 2014 FPGA implementation of 3D-displacement measurement based on 2D-DIC and FPP

Zhenkun Lei, Fangxu Zhang, Xuan Li

Proceedings Volume 9233, International Symposium on Photonics and Optoelectronics 2014; 923304 (2014) https://doi.org/10.1117/12.2069992
Event: International Symposium on Photonics and Optoelectronics (SOPO 2014), 2014, Suzhou, China

Abstract

Nondestructive optical techniques have been widely used to satisfy engineering applicat ion. 2D digital image correlation (DIC) method has superiority of convenient manipulation and high accuracy in measuring planar displacement. Moreover, fringe pattern profilometry (FPP) method has become a highly developed technique to measure surface profile. Combined with 2D-DIC method, FPP method can be applied to measure three-dimensional displacements conveniently. As a semi-custom integrated circuit, Field-Programmable Gate Array (FPGA) has been popular for its powerful programming performance on controlling experimental instrument. Furthermore, Labview, an efficient graphical programming language which excels in instrument communication, can be used to program FPGA. In this paper, a corrected dynamic FPP method combined with 2D-DIC method has been presented and achieved by Labview programming to measure dynamic deformation. An experimental system including a projector and a camera is used to project fringe patterns and acquire images alternately at a high speed. By the referred method a series of spatial-discrete displacement data in equal intervals of time are obtained. Then a four-dimensional interpolation is adopted to get full-field and continuous-time displacement data. Thus, the planar and out-plane displacements can be simultaneously measured. Experiments were performed and verified the feasibility of proposed method.

Citation Download Citation

Zhenkun Lei, Fangxu Zhang, and Xuan Li "FPGA implementation of 3D-displacement measurement based on 2D-DIC and FPP", Proc. SPIE 9233, International Symposium on Photonics and Optoelectronics 2014, 923304 (21 August 2014); https://doi.org/10.1117/12.2069992

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KEYWORDS

Field programmable gate arrays

Fringe analysis

3D metrology

Cameras

Ions

Projection systems

Digital image correlation

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