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2 June 2014 CCD or CMOS camera calibration using point spread function
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Proceedings Volume 9234, International Conference on Experimental Mechanics 2013 and Twelfth Asian Conference on Experimental Mechanics; 92340Z (2014) https://doi.org/10.1117/12.2048991
Event: International Conference on Experimental Mechanics 2013 and the Twelfth Asian Conference on Experimental Mechanics, 2013, Bangkok, Thailand
Abstract
We present a simple method based on the acquisition of a back-illuminated pinhole to estimate the point spread function (PSF) for CCD (or CMOS) sensor characterization. This method is used to measure the variations in sensitivity of the 2D-sensor array systems. The experimental results show that there is a variation in sensitivity for each position on the CCD of the calibrated camera and the pixel optical center error with respect to the geometrical center is in the range of 1/10th of a pixel. We claim that the pixel error comes most probably from the coherence of the laser light used, or eventually from possible defects in shape, surface quality, optical performance of micro-lenses, and the uniformity of the parameters across the wafer. This may have significant consequences for coherent light imaging using CCD (or CMOS) such as Particle Image Velocimetry.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. G. Abdelsalam, M. Stanislas, and S. Coudert "CCD or CMOS camera calibration using point spread function", Proc. SPIE 9234, International Conference on Experimental Mechanics 2013 and Twelfth Asian Conference on Experimental Mechanics, 92340Z (2 June 2014); https://doi.org/10.1117/12.2048991
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