Translator Disclaimer
16 September 2014 Particle deformation induced by AFM tapping under different setpoint voltages
Author Affiliations +
Proceedings Volume 9236, Scanning Microscopies 2014; 92360W (2014)
Event: SPIE Scanning Microscopies, 2014, Monterey, California, United States
The measured height of polystyrene nanoparticles varies with setpoint voltage during atomic force microscopy (AFM) tapping-mode imaging. Nanoparticle height was strongly influenced by the magnitude of the deformation caused by the AFM tapping forces, which was determined by the setpoint voltage. This influence quantity was studied by controlling the operational AFM setpoint voltage. A test sample consisting of well-dispersed 60-nm polystyrene and gold nanoparticles co-adsorbed on poly-l-lysine-coated mica was studied in this research. Gold nanoparticles have not only better mechanical property than polystyrene nanoparticles, but also obvious facets in AFM phase image. By using this sample of mixed nanoparticles, it allows us to confirm that the deformation resulted from the effect of setpoint voltage, not noise. In tapping mode, the deformation of polystyrene nanoparticles increased with decreasing setpoint voltage. Similar behavior was observed with both open loop and closed loop AFM instruments.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chung-Lin Wu, Natalia Farkas, John A. Dagata, Bo-Ching He, and Wei-En Fu "Particle deformation induced by AFM tapping under different setpoint voltages", Proc. SPIE 9236, Scanning Microscopies 2014, 92360W (16 September 2014);

Back to Top