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31 October 2014 Analysis of the laser damage characteristics of a production lot
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Abstract
This paper reports on the analysis of laser damage measurements made on an entire lot of approximately identically processed and coated samples. Each sample’s test data is analyzed to determine its probability of damage curve, pi(φ). The probability of damage curves are further processed to derive the defect distribution, fi(φ), for each sample. The individual fi(φ) are then examined to determine if they are likely to have come from a single parent distribution, f(φ), which represents the performance of the manufacturing process.
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Jonathan W. Arenberg, Lars O. Jensen, and Detlev Ristau "Analysis of the laser damage characteristics of a production lot", Proc. SPIE 9237, Laser-Induced Damage in Optical Materials: 2014, 923724 (31 October 2014); https://doi.org/10.1117/12.2068336
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