7 October 2014 Radiation-induced charge transfer inefficiency in charge-coupled devices: Sentinel-4 CCD pre-development as a case study
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Abstract
Energetic particles in space damage electronic components, and in particular affect the capability of Charge-Coupled Devices (CCD) to transfer photo-generated charge packets to the output node. If not properly accounted for either during the instrument design process or in the mission data processing pipeline, radiation-induced Charge Transfer Inefficiency (CTI) causes image distortion, decreases the signal-to-noise ratio, and ultimately leads to bias in the measurement carried out. CTI is a well-identified error budget contributor for mission operating in the photon-starving regime like space telescopes dedicated to Astronomy, but is less studied in the context of Earth Observation missions. We present a study conducted during the Sentinel-4/UVN CCD pre-development to provide a first assessment of the CTI effects on the Sentinel-4 measurements.
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T. Prod'homme, T. Prod'homme, J.-M. Belloir, J.-M. Belloir, H. Weber, H. Weber, G. Bazalgette Courrèges-Lacoste, G. Bazalgette Courrèges-Lacoste, R. Meynart, R. Meynart, Y.-R. Nowicki-Bringuier, Y.-R. Nowicki-Bringuier, J. Caron, J. Caron, Y. Levillain, Y. Levillain, C. Woffinden, C. Woffinden, B. Lord, B. Lord, R. Mackie, R. Mackie, } "Radiation-induced charge transfer inefficiency in charge-coupled devices: Sentinel-4 CCD pre-development as a case study", Proc. SPIE 9241, Sensors, Systems, and Next-Generation Satellites XVIII, 92410Y (7 October 2014); doi: 10.1117/12.2072625; https://doi.org/10.1117/12.2072625
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